Applicability of a cut-off reflector for grazing incidence X-ray fluorescence analysis

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 58, Issue 11, 2003, Pages 1895-1900

  Tiwari, M K ^a   Sawhney, K J S ^a  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

Grazing incidence X ray fluorescence; Multilayer; Total reflection X ray fluorescence; X Ray fluorescence

Indexed keywords

ENVIRONMENTAL ENGINEERING; GLASS; MICROMETERS; MULTILAYERS; SEMICONDUCTOR MATERIALS; SPECTROMETERS; TRACE ELEMENTS; X RAY ANALYSIS;

X-RAY ENERGY;

SPECTROMETRY;

EID: 0344466342     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(03)00183-6     Document Type: Article

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