메뉴 건너뛰기




Volumn 42, Issue 34, 2003, Pages 6939-6944

Effect of tin diffusion on the optical behavior of float glass in the soft–x–ray region

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; FLUORESCENCE; IMPURITIES; MASS SPECTROMETRY; MONOCHROMATORS; OPTICAL DATA PROCESSING; PHOTOELECTRON SPECTROSCOPY; REFLECTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICA; SURFACE ROUGHNESS; SYNCHROTRON RADIATION; TIN; X RAY OPTICS;

EID: 0345548543     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.006939     Document Type: Article
Times cited : (9)

References (22)
  • 4
    • 0002452753 scopus 로고    scopus 로고
    • Silicon dioxide (SiO2) (glass)
    • E. D. Palik, ed. (Academic, Orlando, Fla
    • 2) (glass),” in Handbook of Optical Constants of Solids, E. D. Palik, ed. (Academic, Orlando, Fla., 1998), pp. 749-763.
    • (1998) Handbook of Optical Constants of Solids , pp. 749-763
    • Phillipp, H.R.1
  • 5
    • 0036788094 scopus 로고    scopus 로고
    • Optical constants of silicon and silicon dioxide using soft x-ray reflectance measurements
    • P. Tripathi, G. S. Lodha, M. H. Modi, A. K. Sinha, K. J. S. Sawhney, and R. V. Nandedkar, “Optical constants of silicon and silicon dioxide using soft x-ray reflectance measurements,” Opt. Commun. 211, 215-223 (2002).
    • (2002) Opt. Commun. , vol.211 , pp. 215-223
    • Tripathi, P.1    Lodha, G.S.2    Modi, M.H.3    Sinha, A.K.4    Sawhney, K.J.S.5    Nandedkar, R.V.6
  • 6
    • 0036902092 scopus 로고    scopus 로고
    • Measurements of the refractive index of yttrium in the 50-1300-eV energy region
    • B. Sae-lao and R. Soufli, “Measurements of the refractive index of yttrium in the 50-1300-eV energy region,” Appl. Opt. 41, 7309-7316 (2002).
    • (2002) Appl. Opt. , vol.41 , pp. 7309-7316
    • Sae-Lao, B.1    Soufli, R.2
  • 7
    • 0345577337 scopus 로고
    • Surface analysis of float glass by means of x-ray absorption, reflection, and fluorescence analysis
    • M. Huppauff and B. Lengeler, “Surface analysis of float glass by means of x-ray absorption, reflection, and fluorescence analysis,” J. Appl. Phys. 75, 785-791 (1994).
    • (1994) J. Appl. Phys. , vol.75 , pp. 785-791
    • Huppauff, M.1    Lengeler, B.2
  • 8
    • 0345300381 scopus 로고
    • Characterization of the tin diffusion into float glass using glancing angle x-ray characterization
    • P. J. LaPuma, R. L. Snyder, S. Zdzieszynski, and R. Bruckner, “Characterization of the tin diffusion into float glass using glancing angle x-ray characterization,” Adv. X-Ray Anal. 38, 705-709 (1995).
    • (1995) Adv. X-Ray Anal. , vol.38 , pp. 705-709
    • Lapuma, P.J.1    Snyder, R.L.2    Zdzieszynski, S.3    Bruckner, R.4
  • 9
    • 0035311518 scopus 로고    scopus 로고
    • The diffusion mechanism of tin into glass governed by redox reactions during the float process
    • Y. Hayashi, K. Matsumoto, and M. Kudo, “The diffusion mechanism of tin into glass governed by redox reactions during the float process,” J. Non-Cryst. Solids 282, 188-196 (2001).
    • (2001) J. Non-Cryst. Solids , vol.282 , pp. 188-196
    • Hayashi, Y.1    Matsumoto, K.2    Kudo, M.3
  • 10
    • 0035247022 scopus 로고    scopus 로고
    • Surface characterization of float glass related to changes in the optical properties after reheating
    • Y. Hayashi, R. Akiyama, and M. Kudo, “Surface characterization of float glass related to changes in the optical properties after reheating,” Surf. Interface Anal. 31, 87-92 (2001).
    • (2001) Surf. Interface Anal. , vol.31 , pp. 87-92
    • Hayashi, Y.1    Akiyama, R.2    Kudo, M.3
  • 12
    • 0042456287 scopus 로고    scopus 로고
    • Optical constants of float glass, nickel, and carbon from soft x-ray reflectivity measurements
    • I. Diel, J. Friedrich, C. Kunz, S. Di Fonzo, B. R. Muller, and W. Jark, “Optical constants of float glass, nickel, and carbon from soft x-ray reflectivity measurements,” Appl. Opt. 36, 6376 -6382 (1997).
    • (1997) Appl. Opt. , vol.36
    • Diel, I.1    Friedrich, J.2    Kunz, C.3    Di Fonzo, S.4    Muller, B.R.5    Jark, W.6
  • 14
    • 0001630160 scopus 로고    scopus 로고
    • Stable silicon photodiodes for absolute intensity measure-ments in the VUV and soft x-ray regions,”
    • E. M. Gullikson, R. Korde, L. R. Canfield, and R. E. Vest, “Stable silicon photodiodes for absolute intensity measure-ments in the VUV and soft x-ray regions,” J. Electron. Spec-trosc. Relat. Phenom. 80, 313-316 (1996).
    • (1996) J. Electron. Spec-Trosc. Relat. Phenom. , vol.80 , pp. 313-316
    • Gullikson, E.M.1    Korde, R.2    Canfield, L.R.3    Vest, R.E.4
  • 15
    • 0029770596 scopus 로고    scopus 로고
    • Thermal induced structural modification in Pt/C x-ray multilayer mirrors fabricated by electron beam evaporation
    • G. S. Lodha, S. Pandita, A. Gupta, R. V. Nandedkar, and K. Yamashita, “Thermal induced structural modification in Pt/C x-ray multilayer mirrors fabricated by electron beam evaporation,” Appl. Phys. A 62, 29-32 (1996).
    • (1996) Appl. Phys. A , vol.62 , pp. 29-32
    • Lodha, G.S.1    Pandita, S.2    Gupta, A.3    Nandedkar, R.V.4    Yamashita, K.5
  • 17
    • 0001380394 scopus 로고    scopus 로고
    • Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet soft-x-ray region
    • R. Soufli and E. H. Gullikson, “Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet soft-x-ray region,” Appl. Opt. 36, 5499-5507 (1997).
    • (1997) Appl. Opt. , vol.36 , pp. 5499-5507
    • Soufli, R.1    Gullikson, E.H.2
  • 20
    • 0004932883 scopus 로고
    • X-ray interactions: Photoabsorption, scattering, transmission, and reflection at E = 50-30,000 eV, Z = 1-92
    • B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E = 50-30,000 eV, Z = 1-92,” At. Data Nucl. Data Tables 54, 181-343 (1993).
    • (1993) At. Data Nucl. Data Tables , vol.54 , pp. 181-343
    • Henke, B.L.1    Gullikson, E.M.2    Davis, J.C.3
  • 22
    • 0030562697 scopus 로고    scopus 로고
    • X-ray reflectivity: A new tool for the study of glass surfaces
    • J. M. Grimal, P. Chartier, and P. Lehuede, “X-ray reflectivity: a new tool for the study of glass surfaces,” J. Non-Cryst. Solids 196, 128-133 (1996).
    • (1996) J. Non-Cryst. Solids , vol.196 , pp. 128-133
    • Grimal, J.M.1    Chartier, P.2    Lehuede, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.