Synthesis of AlxGa1-xN alloy by solid-phase reaction under high pressure

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 43, Issue 7 B, 2004, Pages

  Saitoh, Hiroyuki ^a   Utsumi, Wataru ^a   Kaneko, Hiroshi ^a   Aoki, Katsutoshi ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

Alxga1 xn alloys; High pressure and temperature; In situ x ray diffraction; Solid phase reaction; Synchrotron radiation

Indexed keywords

CHEMICAL REACTIONS; COMPOSITION; DECOMPOSITION; EPOXY RESINS; GALLIUM NITRIDE; HIGH PRESSURE EFFECTS; HIGH TEMPERATURE EFFECTS; LATTICE CONSTANTS; LIGHT EMITTING DIODES; SCANNING ELECTRON MICROSCOPY; SOLID SOLUTIONS; THIN FILMS; VAPOR PHASE EPITAXY; X RAY DIFFRACTION;

ALXGA1-XN ALLOYS; HIGH PRESSURE AND TEMPERATURE; IN SITU X-RAY DIFFRACTION; SOLID-PHASE REACTIONS; SYNCHROTRON RADIATION (SR);

ALUMINUM ALLOYS;

EID: 4644252337     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.L981     Document Type: Article

References (12)

1. S. J. Pearton, J. C. Zolper, R. J. Shul and F. Ren: J. Appl. Phys. 86 (1999) 1.
2. S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Matsushita and T. Mukai: Appl. Phys. Lett. 76 (2000) 22.
3. M. A. Khan, A. Bhattarai, J. N. Kuznia and D. T. Olson: Appl. Phys. Lett. 63 (1993) 1214.
4. S. Nagahama, T. Yanamoto, M. Sano and T. Mukai: Jpn. J. Appl. Phys. 41 (2002) 5.
5. S. Porowski: J. Cryst. Growth 166 (1996) 583.
6. S. Porowski and I. Grzegory: J. Cryst. Growth 178 (1997) 174.
7. W. Utsumi, H. Saitoh, H. Kaneko, T. Watanuki, K. Aoki and O. Shimomura: Nat. Mater. 2 (2003) 735.
8. W. Utsumi, K. Funakoshi, Y. Katayama, M. Yamakata, T. Okada and O. Shimomura: J. Phys.: Condens. Matter. 14 (2002) 10497.
9. T. Okada, W. Utsumi, H. Kaneko, M. Yamakata and O. Shimomura: Phys. Chem. Minerals 29 (2002) 439.
10. D. J. Weidner, Y. Wang and M. T. Vaughan: Science 266 (1994) 419.
11. F. Yun, M. A. Reshchikov, L. He, T. King and H. Morkoç: J. Appl. Phys. 92 (2002) 4837.
12. S. R. Lee, A. F. Wright, M. H. Crawford, G. A. Petersen, J. Han and R. M. Biefeld: Appl. Phys. Lett. 74 (1999) 3344.