Destratification mechanisms in coherent multilayers

Journal of Metastable and Nanocrystalline Materials

Volumn 19, Issue , 2004, Pages 153-178

  Bobeth, M ^a   Ullrich, A ^a   Pompe, W ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Annealing; Interface Roughening; Layer Degradation; Layer Recession; Monte Carlo Simulation; Multilayers; Phase Morphology; Pinholes; Thermal Stability

Indexed keywords

ANNEALING; COMPUTER SIMULATION; CRYSTAL MICROSTRUCTURE; GRAIN SIZE AND SHAPE; INTERFACES (MATERIALS); MONTE CARLO METHODS; MULTILAYERS; SURFACE ROUGHNESS;

ATOMISTIC SIMULATIONS; COHERENT MULTILAYERS; DESTRATIFICATION; MAGNETOELECTRONICS;

NANOSTRUCTURED MATERIALS;

EID: 4644248831     PISSN: 14226375     EISSN: None     Source Type: Journal    
DOI: 10.4028/www.scientific.net/jmnm.19.153     Document Type: Review

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