Stability in thin film multilayers and microlaminates: The role of free energy, structure, and orientation at interfaces and grain boundaries

Scripta Materialia

Volumn 48, Issue 8, 2003, Pages 1079-1085

  Lewis, A C ^a   Josell, D ^b   Weihs, T P ^a  

^a Johns Hopkins University   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Grain boundary energy; Interfacial free energy; Laminates; Multilayers; Stability

Indexed keywords

CRYSTAL ORIENTATION; DEGRADATION; FREE ENERGY; GRAIN BOUNDARIES; INTERFACES (MATERIALS); INTERMETALLICS; LAMINATES; SOLUBILITY; STRUCTURE (COMPOSITION); TEXTURES; THERMODYNAMICS; THIN FILMS;

MICROLAMINATES;

MULTILAYERS;

EID: 12244280408     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(02)00629-2     Document Type: Article

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