Sensitivity enhancement of surface plasmon resonance imaging using periodic metallic nanowires

Journal of Lightwave Technology

Volumn 26, Issue 11, 2008, Pages 1472-1478

  Byun, Kyung Min ^a,b   Shuler, Michael L ^b   Kim, Sung June ^c   Yoon, Soon Joon ^d   Kim, Donghyun ^d  

^a School of Operations Research and Industrial Engineering   (United States)

^b Kyung Hee University   (South Korea)

^c Seoul National University   (South Korea)

^d Yonsei University   (South Korea)

Author keywords

Imaging; Metallic nanowires; Optical sensors; Sensitivity; Surface plasmons

Indexed keywords

ELECTRIC WIRE; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOWIRES; OPTICAL DATA STORAGE; PHOTONICS; PLASMONS; RESONANCE; SENSITIVITY ANALYSIS; SOLIDS; SURFACE PLASMON RESONANCE; THICK FILMS;

(1 1 0) SURFACE; AND REAL TIME; ENHANCED SENSITIVITY; HIGHLY SENSITIVE; LABEL FREE; LINEAR DETECTION; LOCALIZED SURFACE PLASMONS (LSP); METALLIC NANOWIRES; NANO WIRE STRUCTURES; NANO WIRES; PROPERTY (S); RIGOROUS COUPLED-WAVE ANALYSIS (RCWA); SENSITIVITY ENHANCEMENTS; SURFACE PLASMON POLARITONS (SPPS); SURFACE PLASMON RESONANCE (SPR) IMAGING;

SURFACE REACTIONS;

EID: 46349101662     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2008.922182     Document Type: Article

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