X-ray beam-position monitoring in the sub-micrometre and sub-second regime

Journal of Synchrotron Radiation

Volumn 12, Issue 6, 2005, Pages 795-799

  Bunk, Oliver ^a   Pfeiffer, Franz ^a   Stampanoni, Marco ^a   Patterson, Bruce D ^a   Schulze Briese, Clemens ^a   David, Christian ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Diagnostic tool; Sub pixel resolution; X ray beam position; X ray camera

Indexed keywords

ELECTRON BEAMS; LIGHT SOURCES; NATURAL FREQUENCIES; OPTICAL RESOLVING POWER; SYNCHROTRON RADIATION; X RAY CAMERAS;

BEAM-POSITION MEASUREMENTS; DIAGNOSTIC TOOL; SUB-PIXEL RESOLUTION; X-RAY BEAM POSITION;

PARTICLE BEAM TRACKING;

EID: 33745307100     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049505028189     Document Type: Conference Paper

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