Hard x-ray microscopy with a 130 nm spatial resolution

Review of Scientific Instruments

Volumn 76, Issue 2, 2005, Pages

  Youn, Hwa Shik ^a   Baik, Soo Yeun ^a   Chang, Chang Hwan ^b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Research Institute of Industrial Science and Technology (RIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CESIUM COMPOUNDS; CHARGE COUPLED DEVICES; HELIUM; LIGHT AMPLIFIERS; LIGHT REFLECTION; MONOCHROMATORS; STAINLESS STEEL; SYNCHROTRON RADIATION; TUNGSTEN; X RAYS;

ENERGY RESOLUTION; SPATIAL RESOLUTION; X-RAY MAGNIFICATION; ZERNIKE PHASE;

X RAY MICROSCOPES;

EID: 13744261508     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1841812     Document Type: Article

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