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Volumn 65, Issue 2, 2008, Pages 308-312
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Quantification of E. coli adhesion to polyamides and polystyrene with atomic force microscopy
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Author keywords
Adhesion; AFM; E. coli; Hamaker constants; Intermolecular force; Nylon; Polyamide; Polystyrene; van der Waals
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Indexed keywords
ADHESION;
AMIDES;
AMINO ACIDS;
ATOMIC FORCE MICROSCOPY;
ATOMIC PHYSICS;
ATOMS;
BACTERIOLOGY;
CHEMICALS;
COMPUTER NETWORKS;
ESCHERICHIA COLI;
FLOW INTERACTIONS;
INDOOR AIR POLLUTION;
MICROSCOPES;
MICROSCOPIC EXAMINATION;
MODAL ANALYSIS;
NYLON POLYMERS;
PIGMENTS;
PLASTIC COATINGS;
POLYAMIDES;
POLYMERS;
POLYSTYRENES;
SCANNING PROBE MICROSCOPY;
SPECTROSCOPIC ANALYSIS;
STRENGTH OF MATERIALS;
SURFACE PROPERTIES;
SURFACES;
WATER POLLUTION;
(1 1 0) SURFACE;
ADHESION FORCES;
ATOMIC FORCE (AF);
ATOMIC FORCE MICROSCOPY (AFM);
BACTERIAL INTERACTIONS;
E. COLI;
ELSEVIER (CO);
FOOT TRAFFIC;
FORCE ANALYSIS;
HAMAKER CONSTANTS;
INDOOR AIR POLLUTANTS;
INTERACTION FORCES;
POLY AMIDE 12;
POLYAMIDE 6 (PA 6);
POLYMER POLYMER INTERACTIONS;
VACUUM CLEANING;
WORK OF ADHESION;
IMAGING TECHNIQUES;
NYLON;
POLYAMIDE;
POLYMER;
POLYSTYRENE;
AIR POLLUTANT;
AIR QUALITY;
AMBIENT AIR;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
BACTERIUM ADHERENCE;
ESCHERICHIA COLI;
MOLECULAR INTERACTION;
PRIORITY JOURNAL;
QUANTITATIVE ANALYSIS;
VACUUM;
BACTERIAL ADHESION;
ESCHERICHIA COLI;
MICROSCOPY, ATOMIC FORCE;
MICROSCOPY, ELECTRON, SCANNING;
NYLONS;
POLYSTYRENES;
BACTERIA (MICROORGANISMS);
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EID: 46149102197
PISSN: 09277765
EISSN: None
Source Type: Journal
DOI: 10.1016/j.colsurfb.2008.05.005 Document Type: Article |
Times cited : (24)
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References (32)
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