Fundamental x-ray interaction limits in diagnostic imaging detectors: Spatial resolution

Medical Physics

Volumn 35, Issue 7, 2008, Pages 3180-3193

  Hajdok, G ^a,b,c   Battista, J J ^b,c   Cunningham, I A ^a,c,d  

^a ROBARTS RESEARCH INSTITUTE   (Canada)

^b LONDON REGIONAL CANCER PROGRAM   (Canada)

^c UNIVERSITY OF WESTERN ONTARIO   (Canada)

^d LONDON HEALTH SCIENCES CENTRE   (Canada)

Author keywords

Diagnostic x ray detectors; Diagnostic x ray imaging; Modulation transfer function

Indexed keywords

AMORPHOUS SILICON; CESIUM IODIDE; DROPS; IMAGE RESOLUTION; IODINE COMPOUNDS; LAYERED SEMICONDUCTORS; LEAD COMPOUNDS; MODULATION; MONTE CARLO METHODS; OPTICAL TRANSFER FUNCTION; PHOTODEGRADATION; PHOTONS; SELENIUM COMPOUNDS; X RAY APPARATUS;

AMORPHOUS SILICON (A-SI); CHARACTERISTIC X RAYS; DESIGN AND DEVELOPMENT; DIAGNOSTIC X-RAY IMAGING; DIGITAL X-RAY DETECTOR; HIGH SPATIAL FREQUENCY; INCIDENT PHOTON ENERGY; LOW-SPATIAL FREQUENCY;

X RAY DETECTORS;

CESIUM; LEAD; SELENIUM; SILICON DIOXIDE;

ARTICLE; DIAGNOSTIC IMAGING; MODULATION TRANSFER FUNCTION; MONTE CARLO METHOD; PRIORITY JOURNAL; RADIATION SCATTERING; X RAY;

EID: 46149094193     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.2924219     Document Type: Article

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