High resolution, direct detection X-ray imagers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3977, Issue , 2000, Pages 418-428

  Street, Robert A ^a   Ready, Steve E ^a   Rahn, Jeffrey T ^a   Mulato, Marcelo ^a   Shah, Kanai ^a   Bennett, Paul R ^a   Mei, Ping ^a   Lu, Jeng Ping ^a   Apte, Raj B ^a   Ho, Jackson ^a   van Schuylenbergh, Koenraad ^a   Lemmi, Francesco ^a   Boyce, James B ^a   Nylen, Per ^a   Schieber, Michael ^a   Hermon, Haim ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; IMAGE SENSORS; LEAD COMPOUNDS; LEAKAGE CURRENTS; MERCURY COMPOUNDS; OPTICAL TRANSFER FUNCTION; PHOTOCONDUCTING MATERIALS; SPURIOUS SIGNAL NOISE;

DIRECT DETECTION X-RAY IMAGERS; LEAD IODIDE; MERCURY IODIDE;

MEDICAL IMAGING;

EID: 0033731685     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.384516     Document Type: Conference Paper

References (15)