Performance of a 41x41-cm2 amorphous silicon flat panel x-ray detector for radiographic imaging applications

Medical Physics

Volumn 27, Issue 6, 2000, Pages 1324-1331

  Granfors, Paul R ^a   Aufrichtig, Richard ^a  

^a GE Medical Systems   (United States)

Author keywords

Amorphous silicon; Cesium iodide; Detective quantum efficiency; Digital radiography; Flat panel detector

Indexed keywords

SILICON; CESIUM IODIDE; THALLIUM; UNCLASSIFIED DRUG;

ARTICLE; BIOPHYSICS; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; HUMAN; IMAGE QUALITY; INSTRUMENTATION; DEVICE; DIAGNOSTIC ACCURACY; DIAGNOSTIC IMAGING; IMAGE ANALYSIS; PRIORITY JOURNAL; RADIATION DETECTION; SIGNAL NOISE RATIO; SPATIAL FREQUENCY DISCRIMINATION;

BIOPHYSICS; HUMANS; RADIOGRAPHIC IMAGE ENHANCEMENT; RADIOGRAPHIC IMAGE INTERPRETATION, COMPUTER-ASSISTED; SILICON;

CESIUM IODIDE; COMPUTERIZED TOMOGRAPHY; EFFICIENCY; OPTICAL TRANSFER FUNCTION; QUANTUM EFFICIENCY; SILICON COMPOUNDS; STATISTICS; THALLIUM COMPOUNDS; THIN FILM TRANSISTORS; X RAY DETECTORS; X RAY RADIOGRAPHY;

ADDITIVE SYSTEM NOISE; AMORPHOUS SILICON FLAT-PANEL; CHARACTERISTIC CURVE; DETECTIVE QUANTUM EFFICIENCY; DIGITAL RADIOGRAPHY; FLAT PANEL DETECTORS; THALLIUM DOPED CESIUM IODIDE; THIN-FILM TRANSISTOR (TFTS);

AMORPHOUS SILICON;

EID: 0033623770     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.599010     Document Type: Article

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