Bulk electrical properties of single-walled carbon nanotubes immobilized by dielectrophoresis: Evidence of metallic or semiconductor behavior

Electrophoresis

Volumn 29, Issue 11, 2008, Pages 2266-2271

  Mureau, Natacha ^a   Watts, Paul C P ^a   Tison, Yann ^a   Silva, S Ravi P ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Carbon nanotubes; Conducting AFM; Dielectrophoresis; Electrical characterization; Ohmic conduction

Indexed keywords

ATOMIC FORCE MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES (SWCN); YARN;

CONDUCTING AFM; CURRENT-VOLTAGE MEASUREMENTS; ELECTRICAL CHARACTERIZATION; HIGH FREQUENCY HF; METALLIC BEHAVIORS; METALLICS; OHMIC CONDUCTION; SEMICONDUCTOR BEHAVIOURS; SINGLE-WALLED CARBON; TWO ELECTRODES;

ELECTROPHORESIS;

SINGLE WALLED NANOTUBE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CALCULATION; CONDUCTANCE; DEVICE; ELECTRIC POTENTIAL; ELECTRODE; ELECTROPHORESIS; IMMOBILIZATION; RAMAN SPECTROMETRY; SEMICONDUCTOR; SEPARATION TECHNIQUE;

EID: 45749155983     PISSN: 01730835     EISSN: 15222683     Source Type: Journal    
DOI: 10.1002/elps.200700724     Document Type: Article

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