Characterisation of carbon nanotube materials by Raman spectroscopy and microscopy - A case study of multiwalled and singlewalled samples

Journal of Optoelectronics and Advanced Materials

Volumn 6, Issue 4, 2004, Pages 1269-1274

  Keszler, A M ^a   Nemes, L ^a   Ahmad, S R ^b   Fang, X ^a,b  

^a INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^b CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

Carbon nanotube; Raman spectroscopy; Scanning electron microscopy; Tunneling microscopy

Indexed keywords

AMORPHOUS MATERIALS; ARGON; ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; GRAPHITE; LASERS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

ANTI-STOKES SCATTERING; BAND PARAMETERS; COMPOSITE EXCITATIONS; TUNNELING MICROSCOPY;

CARBON NANOTUBES;

EID: 10944226759     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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