A review of tension test methods for thin films

Materials Research Society Symposium Proceedings

Volumn 1052, Issue , 2008, Pages 3-14

  Sharpe Jr , William N ^a  

^a Johns Hopkins University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL IMAGING; MACRO SCALES; MATERIALS RESEARCH SOCIETY (MRS); MEASUREMENT SYSTEMS; MICRO-ELECTRO- MECHANICAL SYSTEM (MEMS); PROPERTY MEASUREMENTS; STRENGTH (IGC: D5/D6); STRUCTURAL MATERIALS; TENSILE SPECIMENS; TENSION TESTS; TEST METHODS; YOUNG'S MODULUS (IGC: E14/K14);

BUILDING MATERIALS; COATINGS; COMPOSITE MICROMECHANICS; ELECTROCHEMICAL SENSORS; ELECTROMECHANICAL DEVICES; FORCE MEASUREMENT; INDUSTRIAL ENGINEERING; LABELING; LABELS; MATERIALS TESTING; MEASUREMENTS; MECHANICAL PROPERTIES; MECHATRONICS; MEMS; MICROELECTROMECHANICAL DEVICES; MICROMECHANICS; PIGMENTS; SOLIDS; STANDARDIZATION; STRENGTH OF MATERIALS; TENSILE TESTING; TESTING; THICK FILMS; THIN FILMS;

ELECTRONIC EQUIPMENT TESTING;

EID: 45749112153     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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