Inelastic mean free paths of Ge in the range of 2-10 keV electron energy

Surface Science

Volumn 566-568, Issue 1-3 PART 2, 2004, Pages 1174-1178

  Berenyi Z ^a   Aszalos Kiss B ^a   Toth J ^a   Varga, D ^a   Kover L ^a   Tokesi K ^a   Cserny, I ^a   Tanuma, S ^b  

^a INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Electron solid interactions, scattering, diffraction; Electron solid scattering and transmission elastic; Germanium; Polycrystalline surfaces; Reflection spectroscopy

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DIFFRACTION; ELECTRIC POTENTIAL; ELECTRON ENERGY LEVELS; ELECTRON REFLECTION; PARAMETER ESTIMATION; SEMICONDUCTING GERMANIUM; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON-SOLID INTERACTIONS; ELECTRON-SOLID SCATTERING AND TRANSMISSION; FREE PATH; POLYCRYSTALLINE SURFACES;

POLYCRYSTALLINE MATERIALS;

EID: 4544355538     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.06.080     Document Type: Article

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