Characterization and modelling of moisture driven interface failures

Microelectronics Reliability

Volumn 44, Issue 9-11 SPEC. ISS., 2004, Pages 1317-1322

  Van Gils, M A J ^a   Habets, P J J H A ^b   Zhang, G Q ^a,b   Van Driel, W D ^a   Schreurs, P J G ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; FAILURE (MECHANICAL); FINITE ELEMENT METHOD; INTERFACES (MATERIALS); MOISTURE; STANDARDS; THERMOMECHANICAL TREATMENT;

MOISTURE DRIVEN INTERFACE FAILURES; MOISTURE SENSITIVITY LEVEL (MSL) TESTS;

MICROELECTRONICS;

EID: 4544322746     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.07.019     Document Type: Conference Paper

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