Light emission from small technologies. Are silicon based detectors reaching their limits?

Microelectronics Reliability

Volumn 44, Issue 9-11 SPEC. ISS., 2004, Pages 1715-1720

  Remmach, M ^a   Desplats, R ^a   Perdu, P ^a   Roux, J P ^b   Vallet, M ^b   Dudit, S ^c   Sardin, P ^c   Lewis, D ^d  

^a CNES   (France)

^b NPTest   (United States)

^c STMICROELECTRONICS   (France)

^d UNIVERSITÉ BORDEAUX 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC INVERTERS; FIELD EFFECT TRANSISTORS; INTEGRATED CIRCUIT TESTING; LIGHT EMISSION; MOS DEVICES; PHOTONS; SILICON;

PHOTON EMISSION; PICOSECOND IC ANALYSIS (PICA); SILICON BASED DETECTORS; SILICON TECHNOLOGY;

PARTICLE DETECTORS;

EID: 4544281960     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.07.061     Document Type: Conference Paper

References (11)

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