Molecular {(SnO)6} trapped by two {R2Si 2O3} fragments: X-ray single-crystal structure of [(SnO)6(R2Si2O3)2]

Angewandte Chemie - International Edition

Volumn 43, Issue 29, 2004, Pages 3842-3844

  Nehete, Umesh N ^a   Chandrasekhar, Vadapalli ^b   Anantharaman, Ganapathi ^a   Roesky, Herbert W ^a   Vidovic, Denis ^a   Magull, Jörg ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

Cluster compounds; O ligands; Silanes; Structure elucidation; Tin

Indexed keywords

ADDITION REACTIONS; COMPLEXATION; CRYSTAL STRUCTURE; MIXTURES; SILICON; TIN COMPOUNDS; X RAY ANALYSIS;

SILOXANES; X-RAY CRYSTAL STRUCTURE ANALYSIS;

MOLECULAR DYNAMICS;

HEXANE; LIGAND; SILOXANE;

ARTICLE; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; FRAGMENTATION REACTION; X RAY CRYSTALLOGRAPHY;

EID: 4544278027     PISSN: 14337851     EISSN: None     Source Type: Journal    
DOI: 10.1002/anie.200454149     Document Type: Article

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