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Volumn 11, Issue 3, 2007, Pages 331-345
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Carrier lifetime measurements in silicon for photovoltaic applications
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER LIFETIME;
MANUFACTURE;
MICROELECTRONICS;
SEMICONDUCTOR DEVICES;
THIN FILM SOLAR CELLS;
CARRIER LIFETIME MEASUREMENTS;
MANUFACTURING ENVIRONMENTS;
MANUFACTURING PROCESS;
PHOTOCONDUCTIVITY DECAY;
PHOTOVOLTAIC APPLICATIONS;
SEMICONDUCTOR APPLICATIONS;
SEPARATE DETECTION;
SURFACE RECOMBINATIONS;
SILICON WAFERS;
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EID: 45249106375
PISSN: 19385862
EISSN: 19386737
Source Type: Conference Proceeding
DOI: 10.1149/1.2778675 Document Type: Conference Paper |
Times cited : (7)
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References (20)
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