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Volumn 11, Issue 3, 2007, Pages 331-345

Carrier lifetime measurements in silicon for photovoltaic applications

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER LIFETIME; MANUFACTURE; MICROELECTRONICS; SEMICONDUCTOR DEVICES; THIN FILM SOLAR CELLS;

EID: 45249106375     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2778675     Document Type: Conference Paper
Times cited : (7)

References (20)
  • 8
    • 45249107863 scopus 로고    scopus 로고
    • US Patent no. 5,580,828; Issued December 3, 1996
    • US Patent no. 5,580,828; Issued December 3, 1996
  • 10
    • 45249098984 scopus 로고    scopus 로고
    • US Patent no, 6,653,850; Issued November 25, 2006
    • US Patent no, 6,653,850; Issued November 25, 2006


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.