Measuring molecular junctions: What is the standard?

ACS Nano

Volumn 2, Issue 3, 2008, Pages 403-407

  Bumm, Lloyd A ^a  

^a UNIVERSITY OF OKLAHOMA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRONIC PROPERTIES; HEALTH; IMAGING TECHNIQUES; MEASUREMENTS; METALLIZING; MICROSCOPIC EXAMINATION; MOLECULAR STRUCTURE; SCANNING PROBE MICROSCOPY; STANDARDS;

(I ,J) CONDITIONS; (P ,P ,T) MEASUREMENTS; (PL) PROPERTIES; ACCURATE MEASUREMENTS; AMERICAN CHEMICAL SOCIETY (ACS); ATOMIC FORCE (AF); INTERNAL STANDARD (IS); MOLECULAR CONTACTS; MOLECULAR JUNCTIONS; MOLECULE-ELECTRODE CONTACTS; PRACTICAL APPLICATIONS; RESISTANCE VALUES;

MOLECULES;

NANOMATERIAL;

ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONFORMATION; EDITORIAL; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; GENETIC PROCEDURES; INSTRUMENTATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; SURFACE PROPERTY; ULTRASTRUCTURE;

ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; MOLECULAR PROBE TECHNIQUES; NANOSTRUCTURES; NANOTECHNOLOGY; SURFACE PROPERTIES;

EID: 45149099100     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn8001246     Document Type: Article

References (26)

1. Metzger, R. M. Electrical Rectification by a Molecule: The Advent of Unimolecular Electronic Devices. Acc. Chem. Res. 1999, 32, 950-957.
2. Salomon, A.; Cahen, D.; Lindsay, S.; Tomfohr, J.; Engelkes, V. B.; Frisbie, C. D. Comparison of Electronic Transport Measurements on Organic Molecules. Adv. Mater. 2003, 15, 1881-1890.
3. McCreery, R. L. Molecular Electronic Junctions. Chem. Mater. 2004, 16, 4477-4496.
4. Lindsay, S. M.; Ratner, M. A. Molecular Transport Junctions: Clearing Mists. Adv. Mater. 2007, 19, 23-31.
5. Aviram, A.; Ratner, M. A. Molecular Rectifiers. Chem. Phys. Lett. 1974, 29, 277-283.
6. Reed, M. A.; Tour, J. M. Computing with Molecules. Sci. Am. 2000, 282, 86-93.
7. Xu, B.; Tao, N. J. Measurement of Single-Molecule Resistance by Repeated Formation of Molecular Junctions. Science 2003, 301, 1221-1223.
8. Cui, X. D.; Primak, A.; Zarate, X.; Tomfohr, J.; Sankey, O. F.; Moore, A. L.; Moore, T. A.; Gust, D.; Harris, G.; Lindsay, S. M. Reproducible Measurement of Single-Molecule Conductivity. Science 2001, 294, 571-574.
9. Seferos, D. S.; Blum, A. S.; Kushmerick, J. G.; Bazan, G. C. Single-Molecule Charge-Transport Measurements That Reveal Technique-Dependent Perturbations. J. Am. Chem. Soc. 2006, 128, 11260-11267.
10. Holmlin, R. E.; Haag, R.; Chabinyc, M. L.; Ismagilov, R. F.; Cohen, A. E.; Terfort, A.; Rampi, M. A.; Whitesides, G. M. Electron Transport through Thin Organic Films in Metal-Insulator-Metal Junctions Based on Self-Assembled Monolayers. J. Am. Chem. Soc. 2001, 123, 5075-5085.
11. Wang, W.; Lee, T.; Reed, M. A. Mechanism of Electron Conduction in Self-Assembled Alkanethiol Monolayer Devices. Phys. Rev. B 2003, 68, 035416-035417.
12. Sachs, S. B.; Dudek, S. P.; Hsung, R. P.; Sita, L R.; Smalley, J. F.; Newton, M. D.; Feldberg, S. W.; Chidsey, C. E. D. Rates of Interfacial Electron Transfer through π-Conjugated Spacers. J. Am. Chem. Soc. 1997, 119, 10563-10564.
13. Finklea, H. O.; Liu, L.; Ravenscroft, M. S.; Punturi, S. Multiple Electron Tunneling Paths across Self-Assembled Monolayers of Alkanethiols with Attached Ruthenium(II/III) Redox Centers. J. Phys. Chem. 1996, 100, 18852-18858.
14. Fan, F. R. F.; Yang, J.; Cal, L.; Price, D. W.; Dirk S. M.; Kosynkin, D. V.; Yao, Y.; Rawlett, A. M.; Tour, J. M.; Bard, A. J. Charge Transport through Self-Assembled Monolayers of Compounds of Interest in Molecular Electronics. J. Am. Chem. Soc. 2002, 124, 5550-5560.
15. Ishida, T.; Mizutani, W.; Aya, Y.; Ogiso, H.; Sasaki, S.; Tokumoto, H. Electrical Conduction of Conjugated Molecular Sams Studied by Conductive Atomic Force Microscopy. J. Phys. Chem. B 2002, 106, 5886-5892.
16. Monnell, J. D.; Stapleton, J. J.; Dirk, S. M.; Reinerth, W. A.; Tour, J. M.; Allara, D. L.; Weiss, P. S. Relative Conductances of Alkaneselenolate and Alkanethiolate Monolayers on Au{1 1 1}. J. Phys. Chem. B 2005, 109, 20343-20349.
17. Wold, D. J.; Frisbie, C. D. Fabrication and Characterization of Metal-Molecule-Metal Junctions by Conducting Probe Atomic Force Microscopy. J. Am. Chem. Soc. 2001, 123, 5549-5556.
18. Scaini, D.; Castronovo, M.; Casalis, L.; Scoles, G. Electron Transfer Mediating Properties of Hydrocarbons as a Function of Chain Length: A Differential Scanning Conductive Tip Atomic Force Microscopy Investigation. ACS Nano 2008, 2, 507-515.
19. Liu, G.-y.; Xu, S.; Qian, Y. Nanofabrication of Self-Assembled Monolayers Using Scanning Probe Lithography. Acc. Chem. Res. 2000, 33, 457-466.
20. Galperin, M.; Nitzan, A.; Sek S.; Majda, M. Asymmetric Electron Transmission across Asymmetric Alkanethiol Bilayer Junctions. J. Electroanal. Chem. 2003, 550-551, 337-350.
21. Chen, C. J. Introduction to Scanning Tunneling Microscopy, 2nd ed.; Oxford University Press: Oxford, 2007.
22. Bumm, L A.; Arnold, J. J.; Dunbar, T. D.; Allara, D. L.; Weiss, P. S. Electron Transfer through Organic Molecules. J. Phys. Chem. B 1999, 103, 8122-8127.
23. John, N. S.; Pati, S. K; Kulkarni, G. U. Electrical Characteristics of Layered Palladium Alkanethiolates by Conducting Atomic Force Microscopy. Appl. Phys. Lett. 2008, 92, 013120-013123.
24. Cammann, K; Ross, B.; Katerkamp, A.; Reinbold, J.; Renneberg, R. Chemical and Biochemical Sensors. Handbook of Analytical Techniques; Günzler, H., Williams, A., Eds.; Wiley-VCH: New York, 2001; 2 pp 951-1059.
25. Hansma, P. K. Tunneling Spectroscopy: Capabilities, Applications, and New Techniques; Plenum: New York, 1982.
26. Ho, W. Single-Molecule Chemistry. J. Chem. Phys. 2002, 117, 11033-11061.