Electrical characteristics of layered palladium alkanethiolates by conducting atomic force microscopy

Applied Physics Letters

Volumn 92, Issue 1, 2008, Pages

  John, Neena Susan ^a   Pati, S K ^a   Kulkarni, G U ^a  

^a JAWAHARLAL NEHRU CENTRE FOR ADVANCED SCIENTIFIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; ELECTRON TUNNELING; MULTILAYERS; PALLADIUM COMPOUNDS;

BILAYER THICKNESS; DECAY PARAMETER VALUES; NEGATIVE DIFFERENTIAL RESISTANCE;

NANOSTRUCTURED MATERIALS;

EID: 38049082498     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2828340     Document Type: Article

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