Electron emission tip at extremely low bias voltage

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 45, Issue 29-32, 2006, Pages

  Rahman, Faridur ^a   Mizuno, Seigi ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

Field emission (FE); Field ion microscopy (FIM); Tungsten tip

Indexed keywords

LOW TEMPERATURE EFFECTS; MICROSCOPIC EXAMINATION; TUNGSTEN;

ANGULAR CONFINEMENT; ROOM TEMPERATURE; TUNGSTEN TIPS;

ELECTRON EMISSION;

EID: 34548571779     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.L752     Document Type: Article

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