Reflection shadow imaging of crystal surface by low-voltage point- reflection electron microscopy

Ultramicroscopy

Volumn 72, Issue 1-2, 1998, Pages 67-81

  Zhang, Xu ^a,b   Weierstall, Uwe ^a   Spence, John C H ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; IMAGING TECHNIQUES; LIGHT REFLECTION; SEMICONDUCTING GALLIUM ARSENIDE; SURFACES;

POINT PROJECTION ELECTRON MICROSCOPY (PPM); POINT REFLECTION ELECTRON MICROSCOPY (PRM); REFLECTION SHADOW IMAGING;

ELECTRON MICROSCOPY;

ARTICLE; CRYSTAL; ELECTRON MICROSCOPY; GEOMETRY; IMAGE RECONSTRUCTION; INSTRUMENTATION; STEREORADIOGRAPHY;

EID: 0032053711     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00124-1     Document Type: Article

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