Low-energy electron diffraction patterns using field-emitted electrons from tungsten tips

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 45, Issue 4-7, 2006, Pages

  Mizuno, Seigi ^a   Rahman, F ^a   Iwanaga, Masayuki ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

Field emission; Low energy electron diffraction (LEED); Scanning tunneling microscopy (STM)

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRON SCATTERING; SCANNING TUNNELING MICROSCOPY; TUNGSTEN COMPOUNDS;

ELECTRON BEAM OPENING ANGLE; FIELD EMISSION; LOW-ENERGY ELECTRON DIFFRACTION (LEED);

ELECTRON DIFFRACTION;

EID: 32044436076     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.L178     Document Type: Article

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