Calculation of cosmic ray limited maximum DC blocking voltages of high voltage silicon PIN diodes

Solid-State Electronics

Volumn 52, Issue 7, 2008, Pages 1052-1057

  Bauer, Friedhelm D ^a  

^a ABB SWITZERLAND LTD   (Switzerland)

Author keywords

Breakdown voltage; Cosmic ray induced failure; PIN diode; Silicon

Indexed keywords

COMPUTATIONAL METHODS; ELECTRIC BREAKDOWN; IMPACT IONIZATION; MATHEMATICAL MODELS; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SILICON;

BLOCKING VOLTAGES; COSMIC RAY INDUCED FAILURE;

COSMIC RAYS;

EID: 44749089826     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2008.03.006     Document Type: Article

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