Coupled electro-thermal simulations of single event burnout in power diodes

IEEE Transactions on Nuclear Science

Volumn 52, Issue 6, 2005, Pages 2194-2199

  Albadri, A M ^a,b   Schrimpf, R D ^a,b   Walker, D G ^a,c   Mahajan, S V ^c  

^a IEEE   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c VANDERBILT UNIVERSITY   (United States)

Author keywords

Avalanche multiplication; Coupled electrothermal simulations; Single event burnout (SEB)

Indexed keywords

AVALANCHE MULTIPLICATION; COUPLED ELECTROTHERMAL SIMULATIONS; POWER DIODES; SINGLE EVENT BURNOUT (SEB);

CARBON; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ELEMENTARY PARTICLES; IONS; THERMOELECTRICITY;

AVALANCHE DIODES;

EID: 33144461888     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.860691     Document Type: Conference Paper

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