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Volumn 26, Issue 3, 2008, Pages 934-938

Ion beam machining of Si layer deposited on Zerodur® substrate

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAMS; NATURAL FREQUENCIES; SPUTTERING; SUBSTRATES; SURFACE ROUGHNESS;

EID: 44649103192     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2907779     Document Type: Article
Times cited : (3)

References (11)
  • 3
    • 37149024790 scopus 로고    scopus 로고
    • JVTBD9 1071-1023 10.1116/1.2794048.
    • B. Wua and A. Kumar, J. Vac. Sci. Technol. B JVTBD9 1071-1023 10.1116/1.2794048 25, 1743 (2007).
    • (2007) J. Vac. Sci. Technol. B , vol.25 , pp. 1743
    • Wua, B.1    Kumar, A.2
  • 4
    • 84864066696 scopus 로고    scopus 로고
    • OSA Technical Digest (Optical Society of America, Tucson, AZ).
    • A. Schindler, Optical Fabrication & Testing, OSA Technical Digest (Optical Society of America, Tucson, AZ, 2002).
    • (2002) Optical Fabrication & Testing
    • Schindler, A.1
  • 9
    • 20444457024 scopus 로고    scopus 로고
    • JAPIAU 0021-8979 10.1063/1.1856228.
    • N. Savvides, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1856228 97, 053517 (2005).
    • (2005) J. Appl. Phys. , vol.97 , pp. 053517
    • Savvides, N.1
  • 11
    • 0036529319 scopus 로고    scopus 로고
    • JAPNDE 0021-4922 10.1143/JJAP.41.2285.
    • T. Ogawa, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 10.1143/JJAP.41.2285 41, 2285 (2002).
    • (2002) Jpn. J. Appl. Phys., Part 1 , vol.41 , pp. 2285
    • Ogawa, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.