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Volumn 516, Issue 18, 2008, Pages 6293-6299

Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering

Author keywords

Fourier transform infrared spectroscopy; Optical properties; Rietveld analysis; Sputtering; X ray diffraction; Zinc stannate

Indexed keywords

CRYSTAL LATTICES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; RIETVELD ANALYSIS; X RAY DIFFRACTION; ZINC COMPOUNDS;

EID: 44649101331     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.12.118     Document Type: Article
Times cited : (28)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.