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Volumn 516, Issue 18, 2008, Pages 6293-6299
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Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering
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Author keywords
Fourier transform infrared spectroscopy; Optical properties; Rietveld analysis; Sputtering; X ray diffraction; Zinc stannate
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Indexed keywords
CRYSTAL LATTICES;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MAGNETRON SPUTTERING;
OPTICAL PROPERTIES;
RIETVELD ANALYSIS;
X RAY DIFFRACTION;
ZINC COMPOUNDS;
MID INFRARED REFLECTIVITY SPECTRA;
OPTICAL PHONONS;
ZINC STANNATE;
THIN FILMS;
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EID: 44649101331
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2007.12.118 Document Type: Article |
Times cited : (28)
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References (38)
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