Structural characterization of zinc stannate thin films

Journal of Applied Physics

Volumn 91, Issue 3, 2002, Pages 1464-1471

  Young, D L ^a   Williamson, D L ^b   Coutts, T J ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b Department of Geology and Geological Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONVERSION ELECTRONS; CUBIC SPINEL STRUCTURE; DIFFRACTION PEAKS; EDGE SHARING; GLASS SUBSTRATES; INVERSE SPINEL; MOSSBAUER; OCTAHEDRAL SITES; PEAK INTENSITY; POLYCRYSTALLINE THIN FILM; RF-MAGNETRON SPUTTERING; SSBAUER SPECTROSCOPIES; STRUCTURAL CHARACTERIZATION; ZINC STANNATE;

ELECTRON MOBILITY; MAGNETRON SPUTTERING; POSITIVE IONS; SUBSTRATES; THIN FILMS; TIN; X RAY DIFFRACTION;

ZINC;

EID: 0036470061     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1429793     Document Type: Article

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