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Journal of Physics D: Applied Physics

Volumn 35, Issue 2, 2002, Pages 157-161

Far-infrared reflection spectra of PbSrSe thin films grown by molecular beam epitaxy

(4) Yu, G a Jiang, L F a Shen, W Z a Wu, H Z b

a SHANGHAI JIAO TONG UNIVERSITY (China)

b University of Oklahoma (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; FILM GROWTH; LATTICE CONSTANTS; PHONONS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

FAR-INFRARED REFLECTION SPECTRA; HALL MEASUREMENTS; OPTICAL PHONON REFLECTION BANDS;

MOLECULAR BEAM EPITAXY;

EID: 0037148322 PISSN: 00223727 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3727/35/2/308 Document Type: Article

Times cited : (16)

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