Far infrared properties of bulk sintered and thin film Zn2SnO4

Materials Science and Engineering: B

Volumn 138, Issue 1, 2007, Pages 7-11

  Nikolic M V ^a   Ivetic T ^b   Young, D L ^c   Paraskevopoulos, K M ^d   Zorba, T T ^d   Blagojevic V ^e   Nikolic P M ^b   Vasiljevic Radovic D ^f   Ristic M M ^b  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b INSTITUTE OF TECHNICAL SCIENCES   (Serbia)

^c NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^d ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^e UNIVERSITY OF BELGRADE   (Serbia)

^f IHTM Institute of Microelectronic Technologies and Single Crystals   (Serbia)

Author keywords

Infrared spectroscopy; Optical properties; Thin films; Zinc stannate

Indexed keywords

GRAIN BOUNDARIES; INFRARED SPECTROSCOPY; MAGNETRON SPUTTERING; OPTICAL VARIABLES MEASUREMENT; SINTERING; ZINC COMPOUNDS;

GLASS SUBSTRATES; OPTICAL PHONONS; ROOM TEMPERATURE; ZINC STANNATE;

THIN FILMS;

EID: 33847301632     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.12.005     Document Type: Article

References (23)

1. Coutts T.J., Young D.L., Li X., Mullingan W.P., and Wu X. J. Vac. Sci. Technol. A 18 6 (2000) 2646-2660
2. Young D.L., Mountinho H., Yan Y., and Coutts T.J. J. Appl. Phys. 92 (2002) 310-319
3. Yu J.H., and Choi G.M. J. Electroceram. 8 (2003) 249-255
4. Nikolić N., Srećković T., and Ristić M.M. J. Eur. Ceram. Soc. 21 (2001) 2071-2074
5. Satoh K., Kokehi Y., Okamoto A., and Murakami S. Jpn. J. Appl. Phys. 44 (2005) L34-L37
6. Wang J.X., Xie S.S., Yuan H.J., Dan X.Q., Liu D.F., Gao Y., Zhou Z.P., Song L., Liu L.F., Zhao X.W., Dou X.Y., Zhou W.Y., and Wang G. Solid State Commun. 131 (2004) 435-440
7. Li Y., and Ma X.L. Phys. Stat. Sol. 202 (2005) 435-440
8. Wu X., Asher S., Levi D.H., King D.E., Yan Y., Gessert T.A., and Sheldon P. J. Appl. Phys. 89 (2001) 4564-4569
9. Ivetic T., Nikolic M.V., Young D.L., Vasiljevic-Radovic D., and Urosevic D. Mater. Sci. Forum 518 (2006) 465-470
10. M.V. Nikolic, T. Ivetic, K.M. Paraskevopoulos, K.T. Zorbas, V. Blagojevic, D. Vasiljevic-Radovic, Electroceramics, Toledo, Spain, June, 2006, 18-22, 175.
11. Choiznet J., Deschanvers A., and Raveau B. Comptes Rendes Serie C Sciences Chimiques 266 (1968) 543-548 (ICSD 28235)
12. Segev D., and Wei S.-H. Phys. Rev. B 71 (2005) 125129
13. Su-Huai W., and Zhang S.B. Phys. Rev. B 63 (2001) 045112
14. Gervais F., and Piriou B. Phys. Rev. B 10 (1974) 1642-1654
15. Almeida B.G., Pietka A., Caldelas P., Mendes J.A., and Ribeiro J.L. Thin Solid Films 513 (2006) 275-282
16. Yu G., Jiang L.F., Shen W.Z., and Wu H.Z. J. Phys. D: Appl. Phys. 35 (2002) 157-161
17. Kirk C.T. Phys. Rev. B 38 (1988) 1255-1273
18. Thibaudeau P., and Gervais F. J. Phys.: Condens. Matter 14 (2002) 3543-3552
19. Porotnikov N.V., Savenko V.G., and Sidorova O.V. Zh. Neorg. Khim. 28 (1983) 1653-1655
20. Porotnikov N.V., Savenko V.G., and Sidorova O.V. Rus. J. Inorg. Chem. 28 (1983) 983
21. Lutz H.D., and Haeusler H. J. Mol. Struct. 511-512 (1999) 69-75
22. Kringe C., Oft B., Schellenschlaeger V., and Lutz H.D. J. Mol. Struct. 596 (2001) 25-32
23. Lutz H.D., Mueller B., and Steiner H.J. J.Solid State Chem. 90 (1991) 54-60