Ring generators - New devices for embedded test applications

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 23, Issue 9, 2004, Pages 1306-1320

  Mrugalski, Grzegorz ^a   Rajski, Janusz ^a   Tyszer, Jerzy ^b  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Built in self test; Design for testability; Linear feedback shift registers (LFSRs); Phase shifters; Transition function preserving transformations

Indexed keywords

CRYPTOGRAPHY; DATA COMMUNICATION SYSTEMS; DATA COMPRESSION; DESIGN FOR TESTABILITY; INTEGRATED CIRCUIT LAYOUT; LOGIC DESIGN; LOGIC GATES; MATRIX ALGEBRA; PHASE SHIFTERS; POLYNOMIALS; TRANSFER FUNCTIONS;

BUILT-IN SELF-TEST (BIST); CELLULAR AUTOMATA (CA); LINEAR FEEDBACK SHIFT REGISTERS (LFSR); TRANSITION FUNCTION PRESERVING TRANSFORMATIONS;

SHIFT REGISTERS;

EID: 4444372462     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2004.831584     Document Type: Article

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