Characterization of polymer blends by atomic force microscopy: A review

Polymer News

Volumn 29, Issue 6, 2004, Pages 176-183

  Woodcock, Sara E ^a   Johnson, William C ^a   Chen, Zhan ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Annealing; Atomic force microscopy; Film thickness; Polymer blends; Polymer water interface; Solvent and substrate effects; Surface structure and topography

Indexed keywords

ADHESION; ANNEALING; ATOMIC FORCE MICROSCOPY; FRICTION; MORPHOLOGY; OPTICAL MICROSCOPY; PHOTODIODES; SCANNING; SPIN COATING; SURFACE STRUCTURE; SURFACE TOPOGRAPHY;

FILM THICKNESS; POLYMER/WATER INTERFACE; SOLVENT AND SUBSTRATE EFFECTS; SURFACE STRUCTURE AND TOPOGRAPHY;

POLYMER BLENDS;

EID: 4444321667     PISSN: 00323918     EISSN: None     Source Type: Journal    
DOI: 10.1080/00323910490981056     Document Type: Review

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