Thickness of spin-cast polymer thin films determined by angle-resolved XPS and AFM tip-scratch methods

Langmuir

Volumn 16, Issue 5, 2000, Pages 2281-2284

  Ton That, C ^a   Shard, A G ^a   Bradley, R H ^a  

^a ROBERT GORDON UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ATOMIC FORCE MICROSCOPY; COMPUTATIONAL METHODS; MICA; PLASTICS CASTING; POLYMETHYL METHACRYLATES; POLYSTYRENES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

TIP-SCRATCH METHOD;

PLASTIC FILMS;

EID: 0033875744     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la990605c     Document Type: Article

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