Compact modeling of the noise of a bipolar transistor under DC and AC current crowding conditions

IEEE Transactions on Electron Devices

Volumn 51, Issue 9, 2004, Pages 1483-1495

  Paasschens, Jeroen C J ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPACT MODELING; CURRENT CROWDING; DIRECT CURRENT BEHAVIOR; INTRINSIC TRANSISTOR; NOISE BEHAVIOR;

CALCULATIONS; ELECTRIC CURRENTS; EQUIVALENT CIRCUITS; GEOMETRY; SCHEMATIC DIAGRAMS; SEMICONDUCTOR DEVICE MODELS; SHOT NOISE; THERMAL NOISE;

BIPOLAR TRANSISTORS;

EID: 4444246012     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2004.833580     Document Type: Article

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