Intersubband transitions in ZnO multiple quantum wells

Applied Physics Letters

Volumn 92, Issue 19, 2008, Pages

  Belmoubarik, M ^a   Ohtani, K ^a   Ohno, H ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT; PHOTOCURRENTS; POLARIZATION; THICKNESS MEASUREMENT; ZINC OXIDE;

ENERGY RANGE; INTERSUBBAND TRANSITION; INTERSUBBAND TRANSITIONS; PHOTOCURRENT SPECTROSCOPY;

SEMICONDUCTOR QUANTUM WELLS;

EID: 44049088081     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2926673     Document Type: Article

References (18)

1. P. Zu, Z. K. Tang, G. K. L. Wong, M. Kawasaki, A. Ohtomo, H. Koinuma, and Y. Segawa, Solid State Commun. SSCOA4 0038-1098 10.1016/S0038-1098(97)00216-0 103, 459 (1997).
2. A. Tsukazaki, A. Ohtomo, T. Onuma, M. Ohtani, T. Makino, M. Sumiya, K. Ohtani, S. F. Chichibu, S. Fuke, Y. Segawa, H. Ohno, H. Koinuma, and M. Kawasaki, Nat. Mater. NMAACR 1476-1122 10.1038/nmat1284 4, 42 (2005).
3. A. Ohtomo, K. Tamura, M. Kawasaki, T. Makino, Y. Segawa, Z. K. Tang, G. K. L. Wong, Y. Matsumoto, and H. Koinuma, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1315340 77, 2204 (2000).
4. T. Makino, Y. Segawa, M. Kawasaki, A. Ohtomo, R. Shiroki, K. Tamura, T. Yasuda, and H. Koinuma, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1350632 78, 1237 (2001).
5. T. Makino, Y. Segawa, M. Kawasaki, and H. Koinuma, Semicond. Sci. Technol. SSTEET 0268-1242 10.1088/0268-1242/20/4/010 20, S78 (2005).
6. L. Esaki and H. Sakaki, IBM J. Res. Dev. IBMJAE 0018-8646 14, 61 (1970).
7. J. Faist, F. Capasso, D. L. Sivco, C. Sirtori, A. L. Hutchinson, and A. Y. Cho, Science SCIEAS 0036-8075 10.1126/science.264.5158.553 264, 553 (1994).
8. Y. Hirayama, J. H. Smet, L.-H. Peng, C. G. Fonstad, and E. P. Ippen, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 10.1143/JJAP.33.890 33, 890 (1994).
9. A. Ohtomo, M. Kawasaki, T. Koida, K. Masubuchi, H. Koinuma, Y. Sakurai, Y. Yoshida, T. Yasuda, and Y. Segawa, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.121384 72, 2466 (1998).
10. C. Morhain, T. Bretagnon, P. Lefebvre, X. Tang, P. Valvin, T. Guillet, B. Gill, T. Taliercio, M. Teisseire-Doninelli, B. Vinter, and C. Deparis, Phys. Rev. B PRBMDO 0163-1829 72, 241305 (R) (2005).
11. M. Leroux, N. Grandjean, J. Massies, B. Gil, P. Lefebvre, and P. Bigenwald, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.60.1496 60, 1496 (1999).
12. G. Coli and K. K. Bajaj, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1370116 78, 2861 (2001).
13. H. Z. Xu, K. Ohtani, M. Yamao, and H. Ohno, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2337541 89, 071918 (2006).
14. M. Belmoubarik, K. Ohtani, and H. Ohno (unpublished).
15. B. F. Levine, A. Zussman, S. D. Gunapala, M. T. Asom, J. M. Kuo, and W. S. Hobson, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.352210 72, 4429 (1992).
16. A. Tsukazaki, A. Ohtomo, T. Kita, Y. Ohno, H. Ohno, and M. Kawasaki, Science SCIEAS 0036-8075 10.1126/science.1137430 315, 1388 (2007).
17. S. L. Chuang and C. S. Chang, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.54.2491 54, 2491 (1996).
18. K. Hoshino, T. Someya, K. Hirakawa, and Y. Arakawa, Phys. Status Solidi A PSSABA 0031-8965 10.1002/1521-396X(200207)192:1<27::AID-PSSA27>3.0.CO;2-R 192, 27 (2002).