Crystallography of TiSi2 (C54) epitaxy on (111)Si and (001)Si surfaces

Thin Solid Films

Volumn 516, Issue 16, 2008, Pages 5498-5502

  Zhang, Ming Xing ^a   Qiu, Dong ^a   Kelly, Patrick M ^a  

^a UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

C54 structure; Edge to edge matching; Epitaxial growth; Orientation relationship; TiSi2

Indexed keywords

CRYSTALLOGRAPHY; EPITAXIAL GROWTH; MOLECULAR MODELING; PHASE TRANSITIONS; TEXTURES; THIN FILMS; TITANIUM COMPOUNDS;

ATOMIC SPACING; C54 STRUCTURE; DIFFUSION CONTROLLED PHASE TRANSFORMATIONS; EDGE TO EDGE MATCHING; ORIENTATION RELATIONSHIP;

SINGLE CRYSTAL SURFACES;

EID: 43949098575     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.07.036     Document Type: Article

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