Application of edge-to-edge matching model to understand the in-plane texture of TiSi2 (C49) thin films on (0 0 1)Si surface

Scripta Materialia

Volumn 55, Issue 7, 2006, Pages 613-616

  Zhang, M X ^a   Kelly, P M ^a  

^a UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

Edge to edge matching; Epitaxial growth; Orientation relationship; TiSi2

Indexed keywords

CRYSTALLOGRAPHY; EPITAXIAL GROWTH; PATTERN MATCHING; PHASE TRANSITIONS; THIN FILMS;

EDGE-TO-EDGE MATCHING; ORIENTATION RELATIONSHIP; THIN FILM MATERIALS; TISI2;

TITANIUM COMPOUNDS;

EID: 33746221351     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2006.06.006     Document Type: Article

References (20)

1. Ma Z., and Allen L.H. Phys. Rev. B 49 (1994) 13501
2. Özcan A.S., Ludwig K.F., and Rebbi P. J. Appl. Phys. 92 (2002) 5011
3. Chen L.J., and Tu K.N. Mater. Sci. Rep. 6 (1991) 1
4. Byun J.S. J. Electrochem. Soc. 143 (1996) 1984
5. Komiya S., Tomita H., Ikeda K., Horii Y., and Nakamura T. Jpn. J. Appl. Phys. 35 (1996) 242
6. Saito K., and Arita Y. J. Electrochem. Soc. 143 (1996) 3778
7. Wang L.-M., and Wu S.-T. Jpn. J. Appl. Phys. 36 (1997) 6475
8. Yapsir A.S., Choi C.-H., and Lu T.-M. J. Appl. Phys. 67 (1990) 796
9. Bulle-Lieuwma C.W.T., van Ommen A.H., Hornstra J., and Aussems C.N.A.M. J. Appl. Phys. 71 (1992) 2211
10. Bollmann W., and Nissen H.-U. Acta Cryst. A 24 (1968) 546
11. Detavernier C., Özcan A.S., Jordan-Sweet J., Stach E.A., Tersoff J., Ross F.M., and Lavoie C. Nature 426 (2003) 641
12. Kelly P.M., and Zhang P.-M. Mater. Forum. 23 (1999) 41
13. Zhang M.-X., and Kelly P.M. Acta Mater. 53 (2005) 1073
14. Zhang M.-X., and Kelly P.M. Acta Mater. 53 (2005) 1085
15. Shiflet G.J., and Van der Merwer J.H. Metall. Mater. Trans. A 25A (1994) 1895
16. Weatherly G.C., and Zhang W.-Z. Metall. Mater. Trans. A 25A (1994) 1865
17. Ye F., and Zhang W.-Z. Acta Mater. 50 (2002) 2761
18. Zhang W.-Z., and Weatherly G.C. Acta Mater. 46 (1998) 1837
19. Sukow C.A., and Nemanich R.J. J. Mater. Res. 9 (1994) 1214
20. Chou T.C., Wong C.Y., and Tu K.N. J. Appl. Phys. 62 (1987) 2275