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Volumn 53, Issue 4, 2005, Pages 1085-1096
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Edge-to-edge matching and its applications: Part II. Application to Mg-Al, Mg-Y and Mg-Mn alloys
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Author keywords
Crystallography; Edge to edge matching; Electron diffraction; Interface structure; Magnesium alloys; Phase transformation
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Indexed keywords
ALUMINUM;
ANGLE MEASUREMENT;
CRYSTAL STRUCTURE;
CRYSTALLOGRAPHY;
DIFFUSION;
ELECTRON DIFFRACTION;
INTERFACES (MATERIALS);
LATTICE CONSTANTS;
MAGNESIUM ALLOYS;
MANGANESE;
MORPHOLOGY;
PHASE TRANSITIONS;
PRECIPITATION (CHEMICAL);
REDUCTION;
TRANSMISSION ELECTRON MICROSCOPY;
YTTRIUM;
CLOSED PACKED PLANES;
EDGE-TO-EDGE MATCHING;
INTERFACE STRUCTURE;
PRECIPITATES;
PATTERN MATCHING;
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EID: 12244298233
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2004.11.005 Document Type: Article |
Times cited : (233)
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References (47)
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