Antirandom testing: A distance-based approach

VLSI Design

Volumn 2008, Issue , 2008, Pages

  Jayasumana, Anura P ^a   Wu, Shen Hui ^a   Jandhyala, Sridhar ^a   Malaiya, Yashwant K ^b  

^a Department of Mechanical Engineering   (United States)

^b Department of Computer Science   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRIC FAULT CURRENTS; RANDOM PROCESSES; VECTORS;

ANTIRANDOM TESTING; PSEUDORANDOM TESTING;

VLSI CIRCUITS;

EID: 43949097874     PISSN: 1065514X     EISSN: None     Source Type: Journal    
DOI: 10.1155/2008/165709     Document Type: Article

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