Fast antirandom (FAR) test generation

Proceedings - 3rd IEEE International High-Assurance Systems Engineering Symposium, HASE 1998

Volumn 1998-November, Issue , 1998, Pages 262-269

  Von Mayrhause, A ^b   Chen, T ^a   Hajjar, A ^a   Bai, A ^a   Anderson, C ^b  

^a Department of Mechanical Engineering   (United States)

^b Department of Computer Science   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HAMMING DISTANCE; SOFTWARE TESTING; SYSTEMS ENGINEERING; VECTOR SPACES; VECTORS;

BRANCH COVERAGE; DISTANCE MEASURE; EMPIRICAL EVALUATIONS; LONG SEQUENCES; RANDOM TEST GENERATION; RANDOM VECTORS; TEST GENERATIONS; TESTING CRITERIA;

TESTING;

EID: 50649118739     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HASE.1998.731625     Document Type: Conference Paper

References (9)

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