Cellular automata-based recursive pseudoexhaustive test pattern generator

IEEE Transactions on Computers

Volumn 50, Issue 2, 2001, Pages 177-185

  Dasgupta, Prabir ^a   Chattopadhyay, Santanu ^b   Chaudhuri, P Pal ^c   Sengupta, Indranil ^d  

^a VARIABLE ENERGY CYCLOTRON CENTRE   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI   (India)

^c INDIAN INSTITUTE OF ENGINEERING SCIENCE AND TECHNOLOGY   (India)

^d INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

BIST; Cellular automata; Data path architecture; Pseudoexhaustive testing

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; CELLULAR ARRAYS; COMPUTER ARCHITECTURE; INTEGRATED CIRCUIT TESTING; SET THEORY; THEOREM PROVING; VLSI CIRCUITS;

CELLULAR AUTOMATA; DATA PATH ARCHITECTURE; PSEUDOEXHAUSTIVE TESTING;

RECURSIVE FUNCTIONS;

EID: 0035248427     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.908993     Document Type: Article

References (24)

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