Determination of PIXE spectra from specific depths

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 808-811

  Broadhurst, Anna ^a   Lane, David W ^a   Rogers, Keith D ^a   Lowe, Tim W ^a  

^a CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

Depth profiling; PIXE

Indexed keywords

CADMIUM COMPOUNDS; DATA REDUCTION; DEPOSITION; GLASS; THIN FILMS; X RAY DIFFRACTION;

CDS FILMS; DEPTH PROFILING; GRAZING ANGLE; PIXE;

X RAY ANALYSIS;

EID: 33745834376     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.03.145     Document Type: Article

References (8)

1. Jakšić M., Vajić M., Fazinić S., Rendić D., Tadić T., and Valković V. Nucl. Instr. and Meth. B 40-41 (1989) 643
2. Zhengming L. J. Phys. D: Appl. Phys. 23 (1990) 184
3. Osipowicz T., Liew S.C., Loh K.K., Orlic I., Tang S.M., and Weber Th. Nucl. Instr. and Meth. B 85 (1994) 499
4. Liew S.C., Loh K.K., Orlic I., and Tang S.M. Nucl. Instr. and Meth. B 85 (1994) 621
5. Broadhurst A., Rogers K.D., Lowe T.W., and Lane D.W. Adv. X-ray Anal. 47 (2004) 187
6. Broadhurst A., Rogers K.D., Lowe T.W., and Lane D.W. Acta Cryst. A 61 (2005) 139
7. A. Broadhurst, A novel method for non-destructive depth profiling tomography, Ph.D. thesis, Cranfield University, UK, April 2005.
8. Ketipearachchi U., Lane D.W., Rogers K.D., Painter J.D., and Cousins M.A. Mater. Res. Soc. Symp. Proc. 836 (2005) 161