Nondestructive determination of layers producing Franz-Keldysh oscillations appearing in photoreflectance spectra of heterojunction bipolar transistor structures based on their line-shape analysis

Journal of Applied Physics

Volumn 96, Issue 4, 2004, Pages 1967-1974

  Takeuchi, Hideo ^a   Yamamoto, Yoshitsugu ^a   Nakayama, Masaaki ^b  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

^b Osaka Prefecture University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; MATHEMATICAL MODELS; NONDESTRUCTIVE EXAMINATION; POLARIZATION; RAMAN SPECTROSCOPY; REFLECTION; SEMICONDUCTOR JUNCTIONS; SOLAR CELLS; STOICHIOMETRY; URANATE MINERALS;

ELECTRO-OPTIC ENERGY; FRANZ-KELDYSH OSCILLATIONS; LINE-SHAPE ANALYSIS; PHOTOREFLECTANCE SPECTRA;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 4344662534     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1766416     Document Type: Article

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