On the origins of the Franz-Keldysh oscillations observed in the electromodulation spectra of graded emitter Ga1-xAlxAs/GaAs heterojunction bipolar transistor structures

Journal of Applied Physics

Volumn 83, Issue 8, 1998, Pages 4447-4453

  Sun, W D ^a   Pollak, Fred H ^a  

^a CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000971425     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367205     Document Type: Article

References (26)

1. F. H. Pollak and H. Shen, Mater. Sci. Eng., R. 10, 275 (1993).
2. F. H. Pollak, H. Qiang, D. Yan, Y. Yin, and W. Krystek, J. Met. 46, 55 (1994).
3. F. H. Pollak, H. Qiang, D. Yan, W. Krystek, and S. Moneger, Solid-State Electron. 38, 1121 (1995).
4. F, H. Pollak, W. Krystek, M. Leibovitch, M. L. Gray, and W. S. Hobson, IEEE J. Sel. Top. Quantum Electron.: Appl. Opt. Diagnostics Semicond. 1, 1002 (1995).
5. X. Yin, F. H. Pollak, L. Pawlowicz, T. O'Neill, and M. Hafizi, Appl. Phys. Lett. 56, 1278 (1990).
6. N. Bottka, D. K. Gaskill, P. D. Wright, R. W. Kaliski, and D. A. Williams, J. Cryst. Growth 107, 893 (1991).
7. W. Krystek, H. Qiang, F. H. Pollak, D. C. Streit, and M. Wojtowicz, Inst. Phys. Conf. Ser. 141, 651 (1994).
8. F. H. Pollak, W. Krystek, M. Leibovitch, H. Qiang, D. C. Streit, and M. Wojtowicz, in Proceedings of the International Workshop on Semiconductor haracterization, edited by W. M. Bullis, D. G. Seiler, and A. C. Diebold (American Institute of Physics, Woodbury, 1995), p. 669.
9. F. H. Pollak, V. I. Gavrilenko, W. Krystek, J. L. Freeouf, D. C. Streit, and M. Wojtowicz, in the Proceedings of ECS Symposium on Diagnostic Techniques for Semiconductor Materials and Devices, edited by P. Rai-Choudhury, J. L. Burton, D. K. Schroder, and T. J. Schaffner, ECS Symp. Proc. ECS PV 87-12 (Electrochemical Society, Pennington, 1997), p. 255.
10. P. B. Smith, A. A. Allerman, and W. M. Duncan, in Proceedings of the International Workshop on Semiconductor Characterization, edited by W. M. Bullis, D. G. Seiler, and A. C. Diebold (American Institute of Physics, Woodbury, 1995), p. 678; also, IEEE J. Sel. Top. Quantum Electron. : Appl. Opt. Diagnostics Semicond. 1, 1011 (1995).
11. P. B. Smith, A. A. Allerman, and W. M. Duncan, in Proceedings of the International Workshop on Semiconductor Characterization, edited by W. M. Bullis, D. G. Seiler, and A. C. Diebold (American Institute of Physics, Woodbury, 1995), p. 678; also, IEEE J. Sel. Top. Quantum Electron. : Appl. Opt. Diagnostics Semicond. 1, 1011 (1995).
12. D. Yan, F. H. Pollak, V. T. Boccio, C. L. Lin, P. D. Kirchner, J. M. Woodall, R. C. Gee, and P. M. Asbeck, Appl. Phys. Lett. 61, 2066 (1992).
13. K. T. Hsu, Y. H. Chen, K. L. Chen, H. P. Chen, H. H. Lin, and G. J. Jan, Appl. Phys. Lett. 64, 1974 (1994).
14. L. W. Yang, P. A. Martin, J. S. Mazurowski, J. M. Ballingall, Y. Yin, D. Yan, F. H. Pollak, W. West, D. B. Davito, and P. D. Kirchner, presented at the 1993 Electronic Materials Conference, Santa Barbara, June 1993 (unpublished).
15. A. Badakhshan, C. Durbin, A. Giordona, R. Glosser, S. A. Lambert, and J. Liu, in Nanostructure Physics and Fabrication, edited by M. A. Reed and W. P. Kirk (Academic, New York, 1989), p. 485.
16. H. Shen and F. H. Pollak, Phys. Rev. B 42, 7097 (1990).
17. M. Cardona, in Modulation Spectroscopy (Academic, New York, 1969).
18. B. O. Seraphin, in Semiconductors and Semimetals, edited by R. K. Willardson and A. C. Beer (Academic, New York, 1972), Vol. 9, p. 1.
19. D.E. Aspnes and N. Bottka, in Semiconductors and Semimetals, edited by R. K. Willardson and A. C. Beer (Academic, New York, 1972), Vol. 9, p. 457.
20. Silvaco Data Systems; Santa Clara, CA.
21. F. H. Pollak, in Properties of Aluminum Gallium Arsenide, edited by S. Adachi (INSPEC, London, 1993), p. 53.
22. S. Adachi, in Properties of Aluminum Gallium Arsenide, edited by S. Adachi (INSPEC, London, 1993), pp. 58 and 66.
23. M. Missous, in Properties of Aluminum Gallium Arsenide, edited by S. Adachi (INSPEC, London, 1993), p. 73.
24. R. Kopf, M. H. Herman, M. L. Schnoes, A. P. Perley, G. Livescu, and M. Ohring, J. Appl. Phys. 71, 5004 (1992).
25. E. S. Snow, O. J. Glembocki, and B. V. Shanabrook, Phys. Rev. B 38, 12483 (1988).
26. F. H. Pollak, in Handbook on Semiconductors, edited by M. Balkanski (North Holland, Amsterdam, 1994), Vol. 2, p. 527.