Reliability and degradation of small molecule-based organic light-emitting devices (OLEDs)

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 8, Issue 2, 2002, Pages 362-371

  Popovic, Zoran D ^a   Aziz, Hany ^a  

^a XEROX RESEARCH CENTRE OF CANADA   (Canada)

Author keywords

Aging; AlQ3; Degradation; OLED; Organic light emitting devices; Reliability; Stability

Indexed keywords

AGING OF MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; EFFICIENCY; ELECTRIC SPACE CHARGE; ELECTROLUMINESCENCE; ELECTRON TRANSPORT PROPERTIES; MOLECULES; POSITIVE IONS; RELIABILITY; SEMICONDUCTING ALUMINUM COMPOUNDS; STABILITY;

DARK SPOTS; EMITTER; HOLE INJECTION; LUMINANCE; ORGANIC LIGHT EMITTING DIODES; TRISHYDROXYQUINOLINE ALUMINUM;

LIGHT EMITTING DIODES;

EID: 0036493223     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/2944.999191     Document Type: Article

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