Ion beam induced charge imaging of charge transport in CdTe and CdZnTe

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 8, 2008, Pages 1300-1306

  Sellin, P J ^a   Davies, A W ^a   Gkoumas, S ^a   Lohstroh, A ^a   Ozsan M E ^a   Parkin, J ^a   Perumal, V ^a   Prekas, G ^a   Veale, M ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

CdTe; CdZnTe; Charge transport; IBIC

Indexed keywords

CARRIER LIFETIME; CHARGE TRANSFER; DRIFT CHAMBERS; ELECTRON MOBILITY; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR MATERIALS;

CHARGE IMAGING; CHARGE TRANSPORT PERFORMANCE; DRIFT MOBILITY;

ION BEAMS;

EID: 43049174573     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.11.074     Document Type: Article

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