Characterization of ion beam induced nanostructures

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 244, Issue 1, 2006, Pages 45-51

  Ghatak, J ^a   Satpati, B ^a   Umananda, M ^a   Kabiraj, D ^b   Som, T ^a   Dev, B N ^a   Akimoto, K ^c   Ito, K ^c   Emoto, T ^d   Satyam, P V ^a  

^a INSTITUTE OF PHYSICS   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c NAGOYA UNIVERSITY   (Japan)

^d TOYOTA NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

Asymmetric X ray bragg reflection; HRTEM; Ion irradiation; Nanoislands; Strain

Indexed keywords

ASYMMETRIC X-RAY BRAGG REFLECTION; HRTEM; ION IRRADIATION; NANOISLANDS;

HIGH RESOLUTION ELECTRON MICROSCOPY; ION BEAMS; METALLIC FILMS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STRAIN; X RAY ANALYSIS;

NANOSTRUCTURED MATERIALS;

EID: 43049102648     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.11.147     Document Type: Conference Paper

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