Burrowing of Pt nanoparticles into SiO 2 during ion-beam irradiation

Journal of Applied Physics

Volumn 92, Issue 7, 2002, Pages 3995-4000

  Hu, Xiaoyuan ^a   Cahill, David G ^a   Averback, Robert S ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; DRIVING FORCES; ION BEAM IRRADIATION; ION DOSE; LOCALIZED DEFECTS; MELT ZONE; PT FILMS; PT NANOPARTICLES; PT PARTICLE;

ALUMINA; ATOMIC FORCE MICROSCOPY; ION BOMBARDMENT; NANOPARTICLES; TRANSMISSION ELECTRON MICROSCOPY;

PLATINUM;

EID: 18644386145     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1503387     Document Type: Article

References (29)

1. C. G. Zimmermann, M. Yeadon, K. Nordlund, J. M. Gibson, and R. S. Averback, Phys. Rev. Lett. 83, 1163 (1999). prl PRLTAO 0031-9007
2. C. G. Zimmermann, K. Nordlund, M. Yeadon, J. M. Gibson, R. S. Averback, U. Kerr, and K. Samwer, Phys. Rev. B 64, 5419 (2001). prb PRBMDO 0163-1829
3. A. Rolland and B. Aufray, Surf. Sci. 162, 530 (1985). sus SUSCAS 0039-6028
4. G. L. Zhou, M. H. Yang, and C. P. Flynn, Phys. Rev. Lett. 77, 4580 (1996). prl PRLTAO 0031-9007
5. V. S. Stepanyuk, D. V. Tsivline, D. I. Bazhanov, W. Hergert, and A. A. Katsnelson, Phys. Rev. B 63, 5406 (2001). prb PRBMDO 0163-1829
6. J. M. Roussel, A. Saul, G. Treglia, and B. Legrand, Phys. Rev. B 55, 10931 (1997). prb PRBMDO 0163-1829
7. M. Menezes, Measuring and Improving Copper-polyimide Adhesion, PhD. Thesis, UIUC (1997).
8. M. Menezes, I. M. Robertson, and H. K. Birnbaum, Mater. Res. Soc. Symp. Proc. 445, 269 (1997). mrs MRSPDH 0272-9172
9. P. M. Ajayan and L. D. Marks, Nature (London) 338, 139 (1989). nat NATUAS 0028-0836
10. B. Xu and S. Tanaka, Supramol. Sci. 5, 227 (1998). suc SUSCFX 0968-5677
11. M. L. Brongersma, E. Snoeks, T. van Dillen, and A. Polman, J. Appl. Phys. 88, 59 (2000). jap JAPIAU 0021-8979
12. M. L. Brongersma, E. Snoeks, and A. Polman, Appl. Phys. Lett. 71, 1628 (1997). apl APPLAB 0003-6951
13. E. Snoeks, T. Veber, A. Cacciato, and A. Polman, J. Appl. Phys. 78, 4723 (1995). jap JAPIAU 0021-8979
14. E. Snoeks, A. Polman, and C. A. Volkert, Appl. Phys. Lett. 65, 2487 (1994). apl APPLAB 0003-6951
15. K. Okumura, S. Hyodo, and S. Noda, J. Phys. Chem. B 102, 2350 (1998). bfk JPCBFK 1089-5647
16. E. Aschauer, R. Fasching, M. Varahram, G. Jobst, G. Urban, G. Nicolussi, W. Husinsky, G. Friedbacher, and M. Grasserbauer, J. Electroanal. Chem. 426, 157 (1997). jea JECHES 0022-0728
17. S. Wei, B. Li, T. Fujimoto, and I. Kojima, Phys. Rev. B 58, 3605 (1998). prb PRBMDO 0163-1829
18. L. M. Terman, Appl. Surf. Sci. 117/118, 1 (1997). asu ASUSEE 0169-4332
19. T. Wang, C. Lee, and L. D. Schmidt, Surf. Sci. 163, 181 (1985). sus SUSCAS 0039-6028
20. M. Chen and L. D. Schmidt, J. Catal. 55, 348 (1978). jtl JCTLA5 0021-9517
21. G. C. Rizza, M. Strobel, K. H. Heinig, and H. Bernas, Nucl. Instrum. Methods Phys. Res. B 178, 83 (2001). nib NIMBEU 0168-583X
22. J. P. Biersack and L. G. Haggmark, Nucl. Instrum. Methods 174, 257 (1980). nui NUIMAL 0029-554X
23. J. P. Biersack and W. G. Eckstein, Appl. Phys. A: Solids Surf. 34, 73 (1984). apa APSFDB 0721-7250
24. N. Eustathopoulos, Wettability at High Temperatures (Pergamon, Amsterdam, 1999).
25. N. Eustathopoulos, E. Ricci, and B. Drevet, "Tension Superficielle," Traite Matériaux Métalliques M67 (Techniques de l'Ingénieur, Paris, 1999).
26. N. Ikemiya, J. Umemoto, S. Hara, and K. Ogino, ISIJ Int. 33, 156 (1993). iit IINTEY 0915-1559
27. N. F. Grigorenko, A. I. Stegny, I. E. Kasich-Pilipenko, Y. V. Naidich, and V. V. Pasichny, (1995) in Proceedings International Conference High Temperature Capillarity, edited by N. Eustathopoulos, Smolenice Castle, May 1994, p. 123.
28. L. D. Landau and E. M. Lifshitz, in Fluid Dynamics, 2nd ed. (Pergamon, London, 1987). Steady flow is assumed in the derivation, see page 60.
29. See, e.g., R. S. Averback and T. Diaz De la Rubia, Solid State Phys. 51, 281 (1988). ssp SSPHAE 0081-1947